Film stresses and electrode buckling in organic solar cells

被引:26
作者
Brand, Vitali [1 ]
Levi, Kemal [1 ]
McGehee, Michae D. [1 ]
Dauskardt, Reinhold H. [1 ]
机构
[1] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
关键词
Organic photovoltaic device; P3HT:PCBM; Bulk heterojunction (BHJ); Stress; Buckling; THIN; COALESCENCE; ADHESION;
D O I
10.1016/j.solmat.2012.04.003
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We investigate the film stresses that develop in the polymer films and metal electrodes of poly(3-hexyl thiophene) (P3HT) and [6,6]-phenyl C61-butyric acid methyl ester (PCBM) bulk heterojunction (BHJ) organic solar cells. A compressive biaxial stress of similar to-36 MPa was measured in PEDOT:PSS while a tensile stress of similar to 6 MPa was measured in the BHJ layer. We then analyze the effect of electrode deposition rate on the film stresses in the Al electrode. Compressive stresses of similar to -100 to -145 MPa in the Al electrode lead to a buckling instability resulting in undulating electrode surface topography. The BHJ layer was found to have the lowest cohesion (similar to 1.5-1.8 J/m(2)) among the layers of the solar cell and dependent on the Al electrode deposition rate. The cohesive failure path in the BHJ layer exhibited the same periodicity and orientation of the Al electrode buckling topography. We discuss the implications of the film stresses on damage processes during device fabrication and operation. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:80 / 85
页数:6
相关论文
共 26 条
[1]   MEASUREMENTS OF THE INTRINSIC STRESS IN THIN METAL-FILMS [J].
ABERMANN, R .
VACUUM, 1990, 41 (4-6) :1279-1282
[2]   Cohesion and device reliability in organic bulk heterojunction photovoltaic cells [J].
Brand, Vitali ;
Bruner, Christopher ;
Dauskardt, Reinhold H. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, 99 :182-189
[3]   Origin of compressive residual stress in polycrystalline thin films [J].
Chason, E ;
Sheldon, BW ;
Freund, LB ;
Floro, JA ;
Hearne, SJ .
PHYSICAL REVIEW LETTERS, 2002, 88 (15) :4
[4]  
Cheng IC, 2009, ELECTRON MATER SCI T, P1, DOI 10.1007/978-0-387-74363-9_1
[5]   Effect of sputtering power of aluminum film in aluminum induced crystallization of low temperature polycrystalline silicon film [J].
Chu, Hsiao-Yeh ;
Weng, Ming-Hang ;
Nien, Chih-Cheng .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4A) :1635-1639
[6]   Adhesion and debonding of multi-layer thin film structures [J].
Dauskardt, R ;
Lane, M ;
Ma, Q ;
Krishna, N .
ENGINEERING FRACTURE MECHANICS, 1998, 61 (01) :141-162
[7]   Interlayer adhesion in roll-to-roll processed flexible inverted polymer solar cells [J].
Dupont, Stephanie R. ;
Oliver, Mark ;
Krebs, Frederik C. ;
Dauskardt, Reinhold H. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2012, 97 :171-175
[8]   MEASUREMENT AND INTERPRETATION OF STRESS IN ALUMINUM-BASED METALLIZATION AS A FUNCTION OF THERMAL HISTORY [J].
FLINN, PA ;
GARDNER, DS ;
NIX, WD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (03) :689-699
[9]   The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films [J].
Floro, JA ;
Hearne, SJ ;
Hunter, JA ;
Kotula, P ;
Chason, E ;
Seel, SC ;
Thompson, CV .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (09) :4886-4897
[10]   Development and measurement of stress in polymer coatings [J].
Francis, LF ;
McCormick, AV ;
Vaessen, DM ;
Payne, JA .
JOURNAL OF MATERIALS SCIENCE, 2002, 37 (22) :4717-4731