Imaging the cell surface: Argon sputtering to expose inner cell structures

被引：7

作者：

De Stasio, G

Frazer, BH

Girasole, M

Wiese, LM

Krasnowska, EK

Greco, G

Serafino, A

Parasassi, T

机构：

[1] Univ Wisconsin, Ctr Synchrotron Radiat, Stoughton, WI 53589 USA

[2] Univ Wisconsin, Dept Phys, Stoughton, WI 53589 USA

[3] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

[4] Ist Struttura Mat, I-00133 Rome, Italy

[5] CNR, Sez Med Mol, Ist Neurobiol & Med Mol, I-00137 Rome, Italy

来源：

MICROSCOPY RESEARCH AND TECHNIQUE | 2004年 / 63卷 / 02期

关键词：

subcellular structure and processes; organelles; X-ray microscopy; biomaterials and biological interfaces;

D O I：

10.1002/jemt.20019

中图分类号：

R602 [外科病理学、解剖学]; R32 [人体形态学];

学科分类号：

100101 ;

摘要：

Established microscopies such as Scanning Electron Microscopy (SEM) and more recent developments such as Atomic Force Microscopy (AFM) and X-ray Photo-Electron Emission spectroMicroscopy (X-PEEM) can only image the sample surface. We present an argon sputtering method able to progressively expose inner cell structures without apparent damage. By varying the sputtering time, the structure of cell cytoskeleton, vesicles, mitochondria, nuclear membrane, and nucleoli can be imaged. We compared images obtained with confocal fluorescence microscopy, transmission electron microscopy (TEM), SEM, and X-PEEM on similar samples after argon sputtering, then confirmed the similarity of reference intracellular structures, including cytoskeleton fibers, cell-cell and cell-substrate adhesion structures, and secretory vesicles. We conclude that the sputtering method is a new valuable tool for surface sensitive microscopies. (C) 2004 Wiley-Liss, Inc.

引用

页码：115 / 121

页数：7