Niobium and tantalum high Q resonators for photon detectors

被引：47

作者：

Barends, R.

Baselmans, J. J. A.

Hovenier, J. N.

Gao, J. R.

Yates, S. J. C.

Klapwijk, T. M.

Hoevers, H. F. C.

机构：

[1] Delft Univ Technol, Kavli Inst Nanosci, Fac Sci Appl, NL-2628 CJ Delft, Netherlands

[2] SRON, Netherlands Inst Space Res, NL-3584 CA Utrecht, Netherlands

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2007年 / 17卷 / 02期

关键词：

dielectric losses; kinetic inductance; photon detection; superconducting resonators;

D O I：

10.1109/TASC.2007.898541

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have measured the quality factors and phase noise of niobium and tantalum coplanar waveguide microwave resonators on silicon. The results of both materials are similar. We reach quality factors up to 10(5). At low temperatures the quality factors show an anomalous increase, while the resonance frequency remains constant for increasing power levels. The resonance frequency starts to decrease at temperatures around a tenth of the critical temperature. The phase noise exhibits a 1/f like slope. We attribute this behavior to the silicon dielectric.

引用

页码：263 / 266

页数：4

共 20 条

[1] RESIDUAL SURFACE-RESISTANCE OF POLYCRYSTALLINE SUPERCONDUCTORS [J].