Thin liquid films studied by atomic force microscopy

被引：50

作者：

Bonaccurso, Elmar ^{[1
]}

Kappl, Michael ^{[1
]}

Butt, Hans-Juergen ^{[1
]}

机构：

[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany

来源：

CURRENT OPINION IN COLLOID & INTERFACE SCIENCE | 2008年 / 13卷 / 03期

关键词：

atomic force microscopy; colloidal probe technique; liquid film drainage; hydrodynamic force; solvation force; hydration force; depletion force; deformable surfaces;

D O I：

10.1016/j.cocis.2007.11.010

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM. (c) 2007 Elsevier Ltd. All rights reserved.

引用

页码：107 / 119

页数：13

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