Polarization dependence of the soft X-ray raman scattering at the L edge of TiO2

被引：9

作者：

Harada, Y

Watanabe, M

Eguchi, R

Ishiwata, Y

Matsubara, M

Kotani, A

Yagishita, A

Shin, S

机构：

[1] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan

[2] Photon Factory, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

[3] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2001年 / 114卷

关键词：

polarization; polarized; depolarized; soft X-ray emission; antibonding; nonbonding;

D O I：

10.1016/S0368-2048(00)00374-1

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Polarization dependence of the soft X-ray Raman scattering was investigated at the Ti 2p absorption edge of TiO2. Strong Raman scattering features appear about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between 3d(1)(L) under bar and 3d(0) states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti 2p absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They show weak polarization dependence and are assigned to be nonbonding type charge transfer excitations. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：969 / 973

页数：5

共 3 条

[1] Spectrometer for polarized soft X-ray Raman scattering [J].