Studies of microstructural imperfections of powdered Zirconium-based alloys

被引：10

作者：

Chowdhury, P. S. ^{[1
]}

Sarkar, A. ^{[2
]}

Mukherjee, P. ^{[1
]}

Gayathri, N. ^{[1
]}

Bhattacharya, M. ^{[1
]}

Barat, P. ^{[1
]}

机构：

[1] Ctr Variable Energy Cyclotron, Kolkata 700064, W Bengal, India

[2] Bhabha Atom Res Ctr, Mech Met Sect, Bombay 400085, Maharashtra, India

来源：

MATERIALS CHARACTERIZATION | 2010年 / 61卷 / 11期

关键词：

X ray diffraction; Microstructure; Deformed Zirconium alloys; X-RAY-DIFFRACTION; WT PERCENT NB; VOIGT-FUNCTION; LATTICE IMPERFECTIONS; CRYSTALS; SIZE; DISLOCATIONS;

D O I：

10.1016/j.matchar.2010.06.019

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

Different model based approaches of X ray diffraction line profile analysis have been applied on the heavily deformed zirconium based alloys in the powdered form to characterize the microstructural parameters like domain size microstrain and dislocation density In characterizing the microstructure of the material these methods are complimentary to each other Though the parameters obtained by different techniques are differently defined and thus not necessarily comparable the values of domain size and microstrain obtained from the different techniques show similar trends (C) 2010 Elsevier Inc All rights reserved

引用

页码：1061 / 1065

页数：5

共 23 条

[1]

AGE HARDENING OF ZR-2.5 WT PERCENT NB SLOWLY COOLED FROM (ALPHA+BETA) PHASE FIELD [J].

ALDRIDGE, SA ;

CHEADLE, BA .

JOURNAL OF NUCLEAR MATERIALS, 1972, 42 (01) :32-&

[2]

AQUA EN, 1967, T METALL SOC AIME, V239, P155

[3]

VOIGT-FUNCTION MODELING IN FOURIER-ANALYSIS OF SIZE-BROADENED AND STRAIN-BROADENED X-RAY-DIFFRACTION PEAKS [J].

BALZAR, D ;

LEDBETTER, H .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 (pt 1) :97-103

[4]

X-RAY-DIFFRACTION STUDY OF LATTICE IMPERFECTIONS IN COLD-WORKED SILVER-GALLIUM (ALPHA-PHASE) ALLOYS [J].

CHATTERJEE, SK ;

HALDER, SK ;

SENGUPTA, SP .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (02) :411-419

[5]

USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J].

DEKEIJSER, TH ;

LANGFORD, JI ;

MITTEMEIJER, EJ ;

VOGELS, ABP .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) :308-314

[6]

ASYMMETRIC X-RAY-LINE BROADENING OF PLASTICALLY DEFORMED-CRYSTALS .1. THEORY [J].

GROMA, I ;

UNGAR, T ;

WILKENS, M .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 :47-53

[7]

X-ray line broadening due to an inhomogeneous dislocation distribution [J].

Groma, I .

PHYSICAL REVIEW B, 1998, 57 (13) :7535-7542

[8]

GROMA I, 1989, J APPL CRYSTALLOGR, V22, P26

[9]

RECOVERY OF COLD-WORK IN EXTRUDED ZR-2.5 WT PERCENT NB [J].

HOLT, RA .

JOURNAL OF NUCLEAR MATERIALS, 1976, 59 (03) :234-242

[10]

X-RAY-DIFFRACTION LINE BROADENING DUE TO DISLOCATIONS IN NON-CUBIC MATERIALS .2. THE CASE OF ELASTIC-ANISOTROPY APPLIED TO HEXAGONAL CRYSTALS [J].

KUZEL, R ;

KLIMANEK, P .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 :363-368

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