High resolution inelastic x-ray scattering spectrometer at the advanced photon source

被引：19

作者：

Schwoerer-Bohning, M ^{[1
]}

Macrander, AT

Abbamonte, PM

Arms, DA

机构：

[1] Argonne Natl Lab, Adv Photon Source, Expt Facil Div, Argonne, IL 60439 USA

[2] Univ Illinois, Dept Phys, Urbana, IL 61801 USA

[3] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 09期

关键词：

D O I：

10.1063/1.1149068

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have commissioned a new instrument for high resolution inelastic x-ray scattering on the inelastic scattering beamline of the Synchrotron Radiation Instrumentation Collaborative Access Team on sector 3 of the Advanced Photon Source. So far, the instrument is set up at 13.84 keV with a total energy resolution of 7.5 meV and a momentum resolution of less than or equal to 0.1 Angstrom(-1). We present technical details of the instrument, which includes an in-line monochromator, a focusing mirror, and a focusing analyzer. The performance of the instrument was demonstrated in studies of phonons in diamond and chromium. (C) 1998 American Institute of Physics. [S0034-6748(98)04109-4]

引用

页码：3109 / 3112

页数：4

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