Hierarchical testing designs for pattern recognition

被引:38
作者
Blanchard, G [1 ]
Geman, D
机构
[1] CNRS, F-75700 Paris, France
[2] Fraunhofer FIRST, IDA Grp, Berlin, Germany
[3] Johns Hopkins Univ, Dept Appl Math & Stat, Baltimore, MD 21218 USA
关键词
classification; sequential hypothesis testing; hierarchical designs; coarse-to-fine search; pattern recognition; scene interpretation;
D O I
10.1214/009053605000000174
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We explore the theoretical foundations of a "twenty questions" approach to pattern recognition. The object of the analysis is the computational process itself rather than probability distributions (Bayesian inference) or decision boundaries (statistical learning). Our formulation is motivated by applications to scene interpretation in which there are a great many possible explanations for the data, one ("background") is statistically dominant, and it is imperative to restrict intensive computation to genuinely ambiguous regions. The focus here is then on pattern filtering: Given a large set Y of possible patterns or explanations, narrow down the true one Y to a small (random) subset (Y) over cap subset of Y of "detected" patterns to be subjected to further, more intense, processing. To this end, we consider a family of hypothesis tests for Y is an element of A versus the nonspecific alternatives Y is an element of A(c). Each test has null type I error and the candidate sets A subset of Y are arranged in a hierarchy of nested partitions. These tests are then characterized by scope (vertical bar A vertical bar), power (or type II error) and algorithmic cost. We consider sequential testing strategies in which decisions are made iteratively, based on past outcomes, about which test to perform next and when to stop testing. The set (Y) over cap is then taken to be the set of patterns that have not been ruled out by the tests performed. The total cost of a strategy is the sum of the "testing cost" and the "postprocessing cost" (proportional to vertical bar(Y) over cap vertical bar) and the corresponding optimization problem is analyzed. As might be expected, under mild assumptions good designs for sequential testing strategies exhibit a steady progression from broad scope coupled with low power to high power coupled with dedication to specific explanations. In the assumptions ensuring this property a key role is played by the ratio cost/power. These ideas are illustrated in the context of detecting rectangles amidst clutter.
引用
收藏
页码:1155 / 1202
页数:48
相关论文
共 30 条
[1]   A coarse-to-fine strategy for multiclass shape detection [J].
Amit, Y ;
Geman, D ;
Fan, XD .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2004, 26 (12) :1606-1621
[2]   A computational model for visual selection [J].
Amit, Y ;
Geman, D .
NEURAL COMPUTATION, 1999, 11 (07) :1691-1715
[3]  
Amit Y., 2002, 2D OBJECT DETECTION
[4]  
[Anonymous], 1961, Adaptive Control Processes: a Guided Tour, DOI DOI 10.1515/9781400874668
[5]  
[Anonymous], 1972, Sequential Analysis and Optimal Design
[6]  
Blackwell D, 1954, Theory of Games and Statistical Decisions
[7]  
BLANCHARD G, 2003, 200307 DEP MATH U PA
[8]  
Breiman L., 1998, CLASSIFICATION REGRE
[9]   Locating faces using statistical feature detectors [J].
Cootes, TF ;
Taylor, CJ .
PROCEEDINGS OF THE SECOND INTERNATIONAL CONFERENCE ON AUTOMATIC FACE AND GESTURE RECOGNITION, 1996, :204-209
[10]  
DeGroot M., 1970, OPTIMAL STAT DECISIO