The relationship of the degree of exposure to a technological disaster and emotional response: A structural model approach

被引:1
作者
Esparcia, AJ
Olmos, JG
机构
[1] Univ Barcelona, Dept Metodol Ciencias Comportament, Fac Psicol, Barcelona 08035, Spain
[2] Univ Barcelona, Dept Personalitat Avaluacio & Tractaments Psicol, Barcelona 08035, Spain
关键词
post-traumatic stress disorder; technological disaster; depression; structural models;
D O I
10.1023/A:1010364325879
中图分类号
C [社会科学总论];
学科分类号
03 ; 0303 ;
摘要
The aim of this study was to analyze type and intensity of psychopathological response (depression and post-traumatic stress disorder) in a population sample from Guadalajara, Mexico, in an area affected by a series of gas explosions in 1992. The study comprised a series of interviews conducted three months after the event. Three groups were formed: subjects directly exposed to the explosions; those affected by the explosions but not directly exposed to them; and a control group. We devised a model, defining that the depressive level is affected by the socioeconomic level and the attributional style; being affected by the exposition degree to the disaster. This question was evaluated as using the structural models technique. The results indicate a close relationship between the variables defined and confirm the action of degree of exposure to the disaster. In fact, a reasonable fit for the model was only obtained in the direct exposure group; the fit was poor in the other two groups, in which results were largely similar. We conclude that the intensity of exposure to the event has a fundamental bearing on victims' psychopathological response, and on the development of posttraumatic stress disorder.
引用
收藏
页码:161 / 171
页数:11
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