High resolution X-ray diffraction studies on hexaphenyl thin films

The direction of the preferred growth of hexaphenyl crystallites within thin films can be adjusted by varying the sample preparation conditions. Two types of samples with different preferred growth are investigated by Theta/2 Theta scans at different tilt angles psi, the preferred growth are characterised by either (00l) or (22-3) planes of hexaphenyl crystallites parallel to the surface of the substrate. In both types of preferred growth the crystallites are highly ordered, the misalignment of the (001) and (22-3) planes relative to the surface of the substrate is within a few degrees. The two types of preferred growth are explained by layer growth of hexaphenyl molecules, the layers are parallel to the surface of the substrate. (C) 1998 Elsevier Science B.V. All rights reserved.