Interpretation of frictional-force microscopy images based on the two-dimensional stick-slip motion of the tip atom

被引：16

作者：

Sasaki, N

Kobayashi, K

Tsukada, M

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 6B期

关键词：

FFM; AFM; atomic-scale friction; 2D stick-slip; tip atom; cantilever; graphite; harmonic potential; Lennard-Jones potential;

D O I：

10.1143/JJAP.35.3700

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Frictional-force microscopy (FFM) images of graphite are calculated by a numerical simulation using a static model. We find that a remarkable transition of the FFM image pattern occurs depending on the cantilever stiffness. This image transition is interpreted based on the two-dimensional stick-slip motion of the tip atom. It is clarified that the frictional force image pattern reflects two kinds of tip atom motion: 1) straight motion and 2) zigzag motion.

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页码：3700 / 3705

页数：6

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