Spatial resolution assessment of Nano-SQUIDs made by focused ion beam

被引：14

作者：

Hao, L. ^{[1
]}

Macfarlane, J. C.

Gallop, J. C.

Romans, E.

Cox, D.

Hutson, D.

Chen, J.

机构：

[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England

[2] Univ Strathclyde, Dept Phys, Glasgow G4 0NG, Lanark, Scotland

[3] UCL, London Ctr Nanotechnol, London WC1H 0AH, England

[4] Univ Surrey, ATI, Surrey GU2 7XH, England

[5] Brunel Univ, Sch Engn & Design, Uxbridge UB8 3PH, Middx, England

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2007年 / 17卷 / 02期

基金：

英国工程与自然科学研究理事会;

关键词：

magnetic field sensitivity; nanoscale SQUID; spatial resolution; superconductor;

D O I：

10.1109/TASC.2007.898068

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The ability to reduce SQUID dimensions into the submicrometer or nanometer regime points the way towards novel applications, particularly in emerging fields such as quantum information processing, single-photon/particle detection, and experimental studies of nano-scale entities such as Bose-Einstein condensates. We report here on our ongoing work combining traditional thin-film and photolithographic fabrication processes with computer-aided-design software and focused ion beam milling to realize sub-micrometer superconducting structures. Their magnetic field sensitivity, noise behavior, spatial resolution, and prospects for magnetic spin detection are discussed.

引用

页码：742 / 745

页数：4

共 6 条

[1] Direct measurement of penetration length in ultrathin and/or mesoscopic superconducting structures [J].