Time domain reflectometry suface reflections for dielectric constant in highly conductive soils

被引:16
作者
Chen, Renpeng
Drnevich, Vincent P.
Yu, Xiong
Nowack, Robert L.
Chen, Yunmin
机构
[1] Minist Educ, Key Lab Soft Soil & Geoenvironm, Hangzhou 310027, Peoples R China
[2] Purdue Univ, Sch Civil Engn, W Lafayette, IN 47907 USA
[3] Case Western Reserve Univ, Dept Civil Engn, Cleveland, OH 44106 USA
[4] Purdue Univ, Dept Earth & Atmospher Sci, W Lafayette, IN 47907 USA
关键词
D O I
10.1061/(ASCE)1090-0241(2007)133:12(1597)
中图分类号
P5 [地质学];
学科分类号
0709 ; 081803 ;
摘要
This paper presents a model-based approach to determine dielectric constants from time domain reflectometry (TDR) measurement in highly conductive soils. It makes use of information contained in the TDR signal from the reflection at the surface of the soil rather than the reflection from the end of the probe. The TDR method is widely used to determine the volumetric water content of soils. Commonly used information from the TDR signals includes the apparent dielectric constant and the electrical conductivity. The apparent dielectric constant is generally measured by analyzing the travel time of electromagnetic waves reflected from the end of the soil probe. In soils with high electrical conductivities, the attenuation of the signal can eliminate the reflection from the end of the probe, which limits the application of TDR to these materials. A simplified frequency-independent dielectric model is utilized to invert the dielectric constant from the reflected signals at the soil surface. Results indicate that the dielectric constant can be determined with reasonable accuracy by the proposed approach for soils with high electrical conductivity, where the conventional travel time analysis fails due to significant signal attenuation.
引用
收藏
页码:1597 / 1608
页数:12
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