Back surface band gap gradings in Cu(In,Ga)Se2 solar cells

被引:126
作者
Dullweber, T
Lundberg, O
Malmström, J
Bodegård, M
Stolt, L
Rau, U
Schock, HW
Werner, JH
机构
[1] Univ Stuttgart, Inst Phys Elekt, D-70569 Stuttgart, Germany
[2] Uppsala Univ, Angstrom Solar Ctr, SE-75121 Uppsala, Sweden
关键词
band gap grading; recombination; back contact; CIGS; Cu(In; Ga)Se-2;
D O I
10.1016/S0040-6090(00)01726-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We fabricate and analyse Cu(In,Ga)Se-2-based solar cells which have a graded band gap by an increased Ga content towards the Mo back contact. The open circuit voltage and the short circuit current strongly improve with the band gap grading. Electronic device analysis reveals that the open circuit voltage increase is directly related to the increased band gap energy at the back surface. We interpret the obtained results to a large extent as reduced back contact recombination by the introduction of an increased band gap close to the back contact. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:11 / 13
页数:3
相关论文
共 11 条
  • [1] [Anonymous], P 25 IEEE PHOT SPEC
  • [2] Contreras MA, 1999, PROG PHOTOVOLTAICS, V7, P311, DOI 10.1002/(SICI)1099-159X(199907/08)7:4<311::AID-PIP274>3.0.CO
  • [3] 2-G
  • [4] Dimmler B., 1987, P 19 IEEE PHOT SPEC, P1454
  • [5] Dullweber T., 1999, 11 INT PHOT SCI ENG, P85
  • [6] HOVEL HJ, 1975, SOLAR CELL SEMICONDU, P11
  • [7] Electronic properties of Cu(In,Ga)Se2 heterojunction solar cells-recent achievements, current understanding, and future challenges
    Rau, U
    Schock, HW
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (02): : 131 - 147
  • [8] Determination of charge carrier collecting regions in chalcopyrite heterojunction solar cells by electron-beam-induced current measurements
    Scheer, R
    Wilhelm, M
    Lewerenz, HJ
    Schock, HW
    Stolt, L
    [J]. SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1997, 49 (1-4) : 299 - 309
  • [9] SCHOCK HW, 2000, P 16 EUR PHOT SOL EN
  • [10] Effects of Ga addition to CuInSe2 on its electronic, structural, and defect properties
    Wei, SH
    Zhang, SB
    Zunger, A
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (24) : 3199 - 3201