Silver and platinum diffusion in alumina single crystals

被引:18
作者
Gontier-Moya, EG [1 ]
Bernardini, J [1 ]
Moya, F [1 ]
机构
[1] Fac Sci St Jerome, Serv B61, UMR CNRS 6137, Lab L2MP, F-13397 Marseille 20, France
关键词
alumina; secondary ion mass spectroscopy (SIMS); diffusion; lattice defects;
D O I
10.1016/S1359-6454(00)00357-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Silver and platinum diffusion in oc-alumina single crystals have been investigated using SIMS technique in 800-1150 degreesC and 900-1200 degreesC temperature ranges. Previous radiotracer measurements yielded higher diffusion coefficients of silver than those presented here. This difference is attributed to the resolution differences between the SIMS and the radiotracer techniques. The former allows us to obtain the bulk diffusion coefficients while the latter the dislocation ones. Silver and platinum diffusion coefficients are one to two orders of magnitude higher than those of chromium and aluminium. It is suggested that such a difference can be related to the ability of low valency cations to occupy interstitial sites, allowing a proportion of the noble elements to dissolve in alumina through the self-compensating mode. Hence, a diffusion mechanism involving correlated jumps of interstitial and substitutional foreign atoms (Ag, Pt) is proposed. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All righrs reseved.
引用
收藏
页码:637 / 644
页数:8
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