Accelerated dynamics simulations of interstitial-cluster growth

被引:22
作者
Birner, S
Kim, J
Richie, DA
Wilkins, JW
Voter, AF
Lenosky, T
机构
[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[2] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
[3] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
[4] Finisar Corp, Sunnyvale, CA 94089 USA
关键词
semiconductors; phase transitions; recombination and trapping;
D O I
10.1016/S0038-1098(01)00391-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We apply parallel replica dynamics to simulate the growth of silicon interstitial clusters. Existing interstitial clusters are efficient traps for mobile interstitial and di-interstitial defects. For clusters involving more than four interstitials, many metastable structures axe achieved by local bonding rearrangements. The shape of interstitial nuclei critically determines the final interstitial clusters. Once an elongated cluster is formed, additional captured interstitials diffuse in the chain direction and eventually settle at the chain ends, resulting in further elongation. (C) 2001 Published by Elsevier Science Ltd.
引用
收藏
页码:279 / 282
页数:4
相关论文
共 14 条
[1]   Self-interstitial clustering in crystalline silicon [J].
Arai, N ;
Takeda, S ;
Kohyama, M .
PHYSICAL REVIEW LETTERS, 1997, 78 (22) :4265-4268
[2]   MODIFIED EMBEDDED-ATOM POTENTIALS FOR CUBIC MATERIALS AND IMPURITIES [J].
BASKES, MI .
PHYSICAL REVIEW B, 1992, 46 (05) :2727-2742
[3]   Evolution of energetics and bonding of compact self-interstitial clusters in Si [J].
Bongiorno, A ;
Colombo, L ;
Cargnoni, F ;
Gatti, C ;
Rosati, M .
EUROPHYSICS LETTERS, 2000, 50 (05) :608-614
[4]   Identification of the tetra-interstitial in silicon [J].
Coomer, BJ ;
Goss, JP ;
Jones, R ;
Öberg, S ;
Briddon, PR .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (01) :L1-L7
[5]   Energetics of self-interstitial clusters in Si [J].
Cowern, NEB ;
Mannino, G ;
Stolk, PA ;
Roozeboom, F ;
Huizing, HGA ;
van Berkum, JGM ;
Cristiano, F ;
Claverie, A ;
Jaraíz, M .
PHYSICAL REVIEW LETTERS, 1999, 82 (22) :4460-4463
[6]   IMPLANTATION AND TRANSIENT B-DIFFUSION IN SI - THE SOURCE OF THE INTERSTITIALS [J].
EAGLESHAM, DJ ;
STOLK, PA ;
GOSSMANN, HJ ;
POATE, JM .
APPLIED PHYSICS LETTERS, 1994, 65 (18) :2305-2307
[7]  
Jaraiz M, 1996, APPL PHYS LETT, V68, P409, DOI 10.1063/1.116701
[8]   Thermally activated reorientation of di-interstitial defects in silicon [J].
Kim, J ;
Kirchhoff, F ;
Aulbur, WG ;
Wilkins, JW ;
Khan, FS ;
Kresse, C .
PHYSICAL REVIEW LETTERS, 1999, 83 (10) :1990-1993
[9]   Stability of Si-interstitial defects: From point to extended defects [J].
Kim, J ;
Kirchhoff, F ;
Wilkins, JW ;
Khan, FS .
PHYSICAL REVIEW LETTERS, 2000, 84 (03) :503-506
[10]   ATOMIC-STRUCTURE AND ENERGY OF THE (113) PLANAR INTERSTITIAL DEFECTS IN SI [J].
KOHYAMA, M ;
TAKEDA, S .
PHYSICAL REVIEW B, 1992, 46 (19) :12305-12315