Mean field annealing (MFA) and optimal design of electromagnetic devices

被引：5

作者：

Rao, LY ^{[1
]}

Yan, WL ^{[1
]}

He, RJ ^{[1
]}

机构：

[1] TSING HUA UNIV,DEPT ELECT ENGN,BEIJING 100084,PEOPLES R CHINA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 03期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1109/20.497463

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an optimal design method by means of mean field annealing (MFA). The mean field theory (MFT) is introduced, and a certain MFA application extension based on Peierls inequality is explained in detail, the critical temperature that is important for classes of problem while applying MFA is discussed. With MFA, the optimal size design of electromagnetic device is carried out. The results are compared with two existing algorithms, the modified simulated annealing (MSA) and one-variable stochastic simulated annealing based MFA (S-MFA), in both operating cost and final quantities, To modify the final results to reach the global optimum, Hooke-Jeeves Pattern Search method is Favorable results show the effectiveness of the scheme.

引用

页码：1218 / 1221

页数：4