High-resolution X-ray fluorescence microtomography of homogeneous samples

被引：71

作者：

Simionovici, A

Chukalina, M

Schroer, C

Drakopoulos, M

Snigirev, A

Snigireva, I

Lengeler, B

Janssens, K

Adams, F

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] Russian Acad Sci, IMT, Chernogolovka 142432, Russia

[3] Univ Aachen, Rhein Westfal TH Aachen, D-52056 Aachen, Germany

[4] Univ Antwerp, MITAC, B-2020 Antwerp, Belgium

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2000年 / 47卷 / 06期

关键词：

algebraic reconstruction method; synchrotron radiation; X-ray fluorescence microtomography; X-ray microprobe;

D O I：

10.1109/23.901180

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

First experimental results of fluorescence microtomography with 6-mum resolution obtained at ESRF, Grenoble, France, are described. The setup comprises high-quality optics (monochromator, mirror, focusing lenses) coupled to the high-energy/brilliance/coherence of the ID 22 undulator beamline. The tomographic setup allows precise measurements in the "pencil-beam" geometry. The image reconstruction is based on a modification of the algebraic reconstruction method but includes simplifications of the model. The quality and precision of the two-dimensional reconstructed elemental images of a phantom sample are encouraging. The method will be further refined and applied for the analysis of more complex inhomogeneous samples.

引用

页码：2736 / 2740

页数：5

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