Modified Ångstrom exponent for the characterization of submicrometer aerosols

被引:185
作者
O'Neill, NT
Dubovik, O
Eck, TF
机构
[1] Sci Syst & Applicat Inc, Lanham, MD 20706 USA
[2] Univ Maryland Baltimore Cty, Goddard Earth Sci & Technol Ctr, Baltimore, MD 21250 USA
[3] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
关键词
D O I
10.1364/AO.40.002368
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The classical Angstrom exponent is an operationally robust optical parameter that contains size information on all optically active aerosols in the field of view of a sunphotometer. Assuming that the optical effects of a typical (radius) size distribution can be approximated by separate submicrometer and supermicrometer components, we show that one can exploit the spectral curvature information in the measured optical depth to permit a direct estimation of a fine-mode (submicrometer) Angstrom exponent (alpha (f)) as well as the optical fraction of fine-mode particles (eta) Simple expressions that enable the estimation of these parameters are presented and tested by use of simulations and measurements. (C) 2001 Optical Society of America.
引用
收藏
页码:2368 / 2375
页数:8
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