A high-resolution large-acceptance analyzer for X-ray fluorescence and Raman spectroscopy

被引:82
作者
Bergmann, U [1 ]
Cramer, SP [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Phys Biosci Div, Berkeley, CA 94720 USA
来源
CRYSTAL AND MULTILAYER OPTICS | 1998年 / 3448卷
关键词
Bragg reflection; K-edge; Raman spectroscopy; Rowland circle; crystal optics; silicon; synchrotron radiation; transition metals; X-ray fluorescence; X-ray absorption;
D O I
10.1117/12.332507
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A newly designed multi-crystal X-ray spectrometer and its applications in the fields of X-ray fluorescence and X-ray Raman spectroscopy are described. The instrument is based on 8 spherically curved Si crystals, each with a 3.5 inch diameter form bent to a radius of 86 cm. The crystals are individually aligned in the Rowland geometry capturing a total solid angle of 0.07 sr. The array is arranged in a way that energy scans can be performed by moving the whole instrument, rather than scanning each crystal by itself. At angles close to back scattering the energy resolution is between 0.3 and 1 eV depending on the beam dimensions at the sample. The instrument is mainly designed for X-ray absorption and fluorescence spectroscopy of transition metals in dilute systems such as metalloproteins. First results of the Mn K beta (3p -> Is) emission in photosystem II are shown. An independent application of the instrument is the technique of X-ray Raman spectroscopy which can address problems similar to those in traditional soft X-ray absorption spectroscopies, and initial results are presented.
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页码:198 / 209
页数:12
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