Low-loss infrared dielectric material system for broadband dual-range omnidirectional reflectivity

被引：41

作者：

Temelkuran, B ^{[1
]}

Thomas, EL ^{[1
]}

Joannopoulos, JD ^{[1
]}

Fink, Y ^{[1
]}

机构：

[1] MIT, Cambridge, MA 02139 USA

来源：

OPTICS LETTERS | 2001年 / 26卷 / 17期

关键词：

D O I：

10.1364/OL.26.001370

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A material system for broadband thermal IR applications based on branched polyethylene and tellurium is introduced. This system exhibits low absorption losses from 3.5 to 35 mum, has a large index contrast, and is readily deposited as a thin film. These unique features were used to investigate the formation of an omnidirectional reflector that exhibits two distinct, broadband omnidirectional ranges at thermal wavelengths. Reflectivity measurements are presented that confirm the existence of two omnidirectional ranges in the solar atmospheric windows extending from 8 to 12 mum and from 4.5 to 5.5 mum. The measurements are in good agreement with simulations. (C) 2001 Optical Society of America.

引用

页码：1370 / 1372

页数：3

共 11 条

[1] All-dielectric one-dimensional periodic structures for total omnidirectional reflection and partial spontaneous emission control [J].