Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores

被引:48
作者
Anderson, MA
Tinsley-Bown, A
Allcock, P
Perkins, EA
Snow, P
Hollings, M
Smith, RG
Reeves, C
Squirrell, DJ
Nicklin, S
Cox, TI
机构
[1] Qinetiq, Malvern WR14 3PS, Worcs, England
[2] Dstl, Chem & Biol Sci, Salisbury SP4 0JQ, Wilts, England
[3] Univ Bath, Dept Phys, Bath BA2 7AY, Avon, England
[4] Dstl, Sevenoaks TN14 7BP, Kent, England
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2003年 / 197卷 / 02期
关键词
D O I
10.1002/pssa.200306558
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The sensitivity of the optical reflectivity of porous silicon structures to the refractive index of liquid within the pores is studied for a single layer, a Bragg mirror and a microcavity. Sucrose solutions of concentration in the range 0.05 to 1.0% by weight are introduced into the pores within a flow cell in order to change the refractive index of the liquid in the pores from 1.3330 to 1.3344. Optimum wavelengths for detection via reflectivity changes are determined based on a signal to noise analysis. The optical thickness of the single layer is also monitored by measuring the fringe spacing via a Fourier transform technique. It is just possible to detect the effect of a change in refractive index of liquid in the pores of 0.00007 for both the reflectivity and optical thickness approaches.
引用
收藏
页码:528 / 533
页数:6
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