High-precision intensity-selective observation of multiphoton ionization: A new method of photoelectron spectroscopy

被引:46
作者
Hansch, P
VanWoerkom, LD
机构
[1] Department of Physics, Ohio State University, Columbus
关键词
D O I
10.1364/OL.21.001286
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have developed a novel method of time-of-flight (TOF) photoelectron spectroscopy that permits observation of multiphoton ionizations with extremely high precision, especially for low-probability events. By scanning the laser-produced ionization region across a pinhole we can select specific laser peak intensities. The volumes occupied by low intensities rise rapidly compared with traditional straight TOF spectroscopy, resulting in high signal gains. This technique presents a new way of observing fundamental laser-matter interactions. (C) 1996 Optical Society of America
引用
收藏
页码:1286 / 1288
页数:3
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