A 3-D multilayer model of scattering by nanostructures. Application to the optimisation of thin coated nano-sources

被引:33
作者
Barchiesi, D
机构
[1] Laboratoire d'Optique P.M. Duffieux, URA CNRS 214 Univ. de Franche-Comte
关键词
D O I
10.1016/0030-4018(95)00712-1
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A multilayer model is applied to near field optical nano-sources. This model is based on the resolution of the Maxwell equations fitting specific boundary conditions. Because of the thin metal coating at the end of a sort of nano-source, a perturbative approach is suitable. The first part will describe the 3D multilayer theory and algorithm, the second part will introduce geometrical considerations on the metal coating of the optical fiber in order to discuss on nano-source coating. The benefit of this model is the interpretation of the phenomenon with the help of spatial Fourier spectrum of the source.
引用
收藏
页码:7 / 13
页数:7
相关论文
共 22 条
[1]   INTERACTION OF ELECTROMAGNETIC-WAVES AT ROUGH DIELECTRIC SURFACES [J].
AGARWAL, GS .
PHYSICAL REVIEW B, 1977, 15 (04) :2371-2383
[2]   A PERTURBATIVE DIFFRACTION THEORY OF A MULTILAYER SYSTEM - APPLICATIONS TO NEAR-FIELD OPTICAL MICROSCOPY SNOM AND STOM [J].
BARCHIESI, D ;
VANLABEKE, D .
ULTRAMICROSCOPY, 1995, 57 (2-3) :196-203
[3]  
BARCHIESI D, 1993, THESIS U BESANCON FR
[4]  
BERGOSSI O, 1994, SPIE, V2341, P239
[5]   BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].
BETZIG, E ;
TRAUTMAN, JK ;
HARRIS, TD ;
WEINER, JS ;
KOSTELAK, RL .
SCIENCE, 1991, 251 (5000) :1468-1470
[6]   NEAR-FIELD DIFFRACTION BY A SLIT - IMPLICATIONS FOR SUPERRESOLUTION MICROSCOPY [J].
BETZIG, E ;
HAROOTUNIAN, A ;
LEWIS, A ;
ISAACSON, M .
APPLIED OPTICS, 1986, 25 (12) :1890-1900
[7]  
DEREUX A, 1993, NATO ASI SERIES E, V242, P189
[8]  
Girard C, 1995, NATO ADV SCI I E-APP, V300, P1
[9]  
GREFFETT JJ, 1988, PHYS REV B, V37, P4636
[10]   SCANNING NEAR-FIELD OPTICAL MICROSCOPY [J].
HEINZELMANN, H ;
POHL, DW .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :89-101