A dose-rate effect in single-particle electron microscopy

被引：45

作者：

Chen, James Z. ^{[1
]}

Sachse, Carsten ^{[1
,2
]}

Xu, Chen ^{[1
]}

Mielke, Thorsten ^{[3
]}

Spahn, Christian M. T. ^{[4
]}

Grigorieff, Nikolaus ^{[1
]}

机构：

[1] Brandeis Univ, Rosentiel Ctr MS029, Howard Hughes Med Inst, Waltham, MA 02545 USA

[2] Fritz Lipmann Inst, Leibniz Inst Altersforsch, D-07745 Jena, Germany

[3] Max Planck Inst Mol Genet, Ultrastrukt Netzwerk, D-14195 Berlin, Germany

[4] Charite Univ Med Berlin, Inst Med Phys & Biophys, D-10117 Berlin, Germany

来源：

JOURNAL OF STRUCTURAL BIOLOGY | 2008年 / 161卷 / 01期

关键词：

single-particle electron cryo-microscopy; beam-induced movement; radiation damage; dose-rate effect; high-resolution EM;

D O I：

10.1016/j.jsb.2007.09.017

中图分类号：

Q5 [生物化学]; Q7 [分子生物学];

学科分类号：

071010 ; 081704 ;

摘要：

A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution. (c) 2007 Elsevier Inc. All rights reserved.

引用

页码：92 / 100

页数：9

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