A novel method for the measurement of Young's modulus for thick-film resistor material by flexural testing of coated beams

被引：20

作者：

Fawcett, N ^{[1
]}

机构：

[1] Ford Motor Co Ltd, Dunton Engn Ctr, Basildon SS15 6EE, Essex, England

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1998年 / 9卷 / 12期

关键词：

elastic modulus; Young's modulus; thick-film coating; flexural testing; 3-point-bend testing; mechanical testing;

D O I：

10.1088/0957-0233/9/12/015

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A method for measuring the Young's modulus of thick-film resistor material is presented. 96% alumina beams were coated with Heraeus 8241 resistor material and flexural tested in the three-point bend mode using a DMA 2980 Thermal Mechanical Analyser. Young's modulus was found to decrease linearly over the 173 K to 573 K temperature range. There was no evidence of non-elastic behaviour. Modulus results for the alumina substrate relate closely to published data. This method could be used to measure the modulus of a wide variety of thick-film coatings on substrates.

引用

页码：2023 / 2026

页数：4