Bulk and surface characterization of a dewetting thin film polymer bilayer

被引：52

作者：

Ade, H ^{[1
]}

Winesett, DA

Smith, AP

Anders, S

Stammler, T

Heske, C

Slep, D

Rafailovich, MH

Sokolov, J

Stöhr, J

机构：

[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv LIght Source, Berkeley, CA 94720 USA

[3] Hilord Chem Corp, Adv Dev & Res, Hauppauge, NY 11788 USA

[4] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA

[5] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 25期

关键词：

D O I：

10.1063/1.122891

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have monitored the progression of the dewetting of a partially brominated polystyrene (PBrS) thin film on top of a polystyrene (PS) thin film with scanning transmission x-ray microscopy (STXM) as well as photoemission electron microscopy (PEEM). We mapped the projected thickness of each constituent polymer species and the total thickness of the film with STXM, while we determined the surface composition with PEEM. Our data show that the PBrS top layer becomes encapsulated during the later stages of dewetting and that atomic force microscopy topographs cannot be utilized to determine the contact angle between PBrS and PS. (C) 1998 American Institute of Ph? sics. [S0003-6951(98)02351-1].

引用

页码：3775 / 3777

页数：3

共 22 条

[1] Ade H, 1997, TRENDS POLYM SCI, V5, P58
[2] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS
ADE, H
ZHANG, X
CAMERON, S
COSTELLO, C
KIRZ, J
WILLIAMS, S
[J]. SCIENCE, 1992, 258 (5084) : 972 - 975
[3] Surface topography and composition of deuterated polystyrene-poly(bromostyrene) blends
Affrossman, S
Henn, G
ONeill, SA
Pethrick, RA
Stamm, M
[J]. MACROMOLECULES, 1996, 29 (14) : 5010 - 5016
[4] X-PEEM study on surface orientation of stylized and rubbed polyimides
Cossy-Favre, A
Diaz, J
Liu, Y
Brown, HR
Samant, MG
Stohr, J
Hanna, AJ
Anders, S
Russell, TP
[J]. MACROMOLECULES, 1998, 31 (15) : 4957 - 4962
[5] COSSYFAVRE A, 1997, ACTA PHYS POL A, V91
[6] Wetting of substrates with phase-separated binary polymer mixtures
Genzer, J
Kramer, EJ
[J]. PHYSICAL REVIEW LETTERS, 1997, 78 (26) : 4946 - 4949
[7] DIFFRACTION-LIMITED IMAGING IN A SCANNING-TRANSMISSION X-RAY MICROSCOPE
JACOBSEN, C
WILLIAMS, S
ANDERSON, E
BROWNE, MT
BUCKLEY, CJ
KERN, D
KIRZ, J
RIVERS, M
ZHANG, X
[J]. OPTICS COMMUNICATIONS, 1991, 86 (3-4) : 351 - 364
[8] SELF-ASSEMBLY OF A HOMOPOLYMER MIXTURE VIA PHASE-SEPARATION
KRAUSCH, G
KRAMER, EJ
RAFAILOVICH, MH
SOKOLOV, J
[J]. APPLIED PHYSICS LETTERS, 1994, 64 (20) : 2655 - 2657
[9] Direct imaging of surface and bulk structures in solvent cast polymer blend films
Kumacheva, E
Li, L
Winnik, MA
Shinozaki, DM
Cheng, PC
[J]. LANGMUIR, 1997, 13 (09) : 2483 - 2489
[10] Dewetting at the liquid-liquid interface
Lambooy, P
Phelan, KC
Haugg, O
Krausch, G
[J]. PHYSICAL REVIEW LETTERS, 1996, 76 (07) : 1110 - 1113

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