Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm

被引：11

作者：

Balling, P. ^{[1
]}

Kren, P. ^{[1
]}

机构：

[1] Czech Metrol Inst, Labs Fundamental Metrol, Prague 15072 5, Czech Republic

来源：

EUROPEAN PHYSICAL JOURNAL D | 2008年 / 48卷 / 01期

关键词：

D O I：

10.1140/epjd/e2007-00325-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper describes the results of absolute frequency measurements of primary wavelength standards 633 nm, 543 nm, 532 nm, (iodine stabilized) and 1540 nm (acetylene stabilized) in CMI. The values obtained with Menlo Systems femtosecond frequency comb in CMI are compared with previous measurements of the same standards in BIPM, BEV and MPQ. Measured sub-Doppler linewidths and relative intensities of several hyperfine spectral components of iodine molecule are also presented.

引用

页码：3 / 10

页数：8

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