Needed resources for software module test, using the hyper-geometric software reliability growth model

被引:25
作者
Hou, RH [1 ]
Kuo, SY [1 ]
Chang, YP [1 ]
机构
[1] SOOCHOW UNIV, DEPT BUSINESS MATH, TAIPEI, TAIWAN
关键词
software reliability; software module testing; resource allocation; Lagrange multiplier method;
D O I
10.1109/24.556577
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Considerable testing-resources are required during software module testing. This paper, based on the 'hyper-geometric distribution software reliability growth model' (HGDM) investigates 2 optimal resource-allocation (ORT/RA) problems in software module testing: 1) minimization of the number of software faults (NSF) still undetected in the system after testing, given a fixed amount of testing resources, and 2) minimization of the total amount of testing resources required, given the NSF still undetected in the system after testing. Based on the concepts of average-allocation & proportional-allocation, two simple allocation methods are introduced, Experimental results show that the OPT/RA method can improve the quality & reliability of the software system much more than the simple allocation methods, Therefore, the OPT/RA method is very efficient for solving the 'testing resource allocation' problem.
引用
收藏
页码:541 / 549
页数:9
相关论文
共 15 条
[1]  
[Anonymous], ACM COMPUT SURV
[2]  
Bazaraa MS., 1993, NONLINEAR PROGRAMMIN
[3]  
HOU RH, IN PRESS IEEE T COMP
[4]  
HOU RH, 1994, P 5 INT S SOFTW REL, P7
[5]  
JACOBY R, 1991, P 13 INT C SOFTW ENG, P226
[6]   MANAGING TEST-PROCEDURES TO ACHIEVE RELIABLE SOFTWARE [J].
KUBAT, P ;
KOCH, HS .
IEEE TRANSACTIONS ON RELIABILITY, 1983, 32 (03) :299-303
[7]   SOFTWARE-RELIABILITY GROWTH-MODEL WITH DEBUGGING EFFORTS [J].
LEUNG, YW .
MICROELECTRONICS AND RELIABILITY, 1992, 32 (05) :699-704
[8]  
Lyu Michael R., 1996, HDB SOFTWARE RELIABI
[9]  
Minohara T, 1995, SIXTH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING, PROCEEDINGS, P324, DOI 10.1109/ISSRE.1995.497673
[10]  
Musa J. D., 1987, Software Reliability, Measurement, Prediction, Application