High-energy PIXE using 68 MeV protons

被引：24

作者：

Denker, A ^{[1
]}

Maier, KH ^{[1
]}

机构：

[1] Hahn Meitner Inst Kernforsch Berlin GmbH, D-14109 Berlin, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1999年 / 150卷 / 1-4期

关键词：

high-energy PIXE; ion beam analysis; nondestructive analysis;

D O I：

10.1016/S0168-583X(98)00922-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The elemental composition of realistic thick samples has been measured with PIXE by 68 MeV protons. Heavy elements can be well detected much deeper below the surface, than with other methods. Measurements on objects d'art are presented. Large and complicated objects can be measured easily. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：118 / 123

页数：6