The combinatorial design approach to automatic test generation

被引：207

作者：

Cohen, DM

Dalal, SR

Parelius, J

Patton, GC

机构：

[1] RUTGERS STATE UNIV,PISCATAWAY,NJ 08855

[2] BELL COMMUN RES INC,SOFTWARE ENGN & STAT RES GRP,MORRISTOWN,NJ 07960

来源：

IEEE SOFTWARE | 1996年 / 13卷 / 05期

关键词：

D O I：

10.1109/52.536462

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the mettled demonstrated good code coverage and fault detection ability.

引用

页码：83 / 88

页数：6

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