Analysis of extended partial least squares for monitoring large-scale processes

被引:27
作者
Chen, Q [1 ]
Kruger, U
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Aerosp Engn, Nanjing 210016, Peoples R China
[2] Queens Univ Belfast, Intelligent Syst & Control Res Grp, Belfast BT5 5AH, Antrim, North Ireland
关键词
data compression; fault diagnosis; process control; process monitoring; statistics;
D O I
10.1109/TCST.2005.852113
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This brief analyzes the recently proposed extended partial least squares (EPLS) algorithm and reveals that it does not: 1) allow the generalized score variables to be geometrically interpreted, 2) reconstruct the recorded process variables, and 3) produce statistically independent variables for process monitoring. To overcome these deficiencies, an improved EPLS algorithm is introduced, which utilizes generalized scores to identify statistical monitoring models. The brief finally presents an industrial application study of a chemical reaction process to show that improved EPLS offers enhanced diagnosis of abnormal process behavior.
引用
收藏
页码:807 / 813
页数:7
相关论文
共 13 条
[1]   PLS regression methods [J].
Höskuldsson, Agnar .
Journal of Chemometrics, 1988, 2 (03) :211-228
[2]  
JACKSON JE, 1991, SER WILEY SERIES PRO
[3]   PROCESS ANALYSIS, MONITORING AND DIAGNOSIS, USING MULTIVARIATE PROJECTION METHODS [J].
KOURTI, T ;
MACGREGOR, JF .
CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, 1995, 28 (01) :3-21
[4]   MULTIVARIATE STATISTICAL MONITORING OF PROCESS OPERATING PERFORMANCE [J].
KRESTA, JV ;
MACGREGOR, JF ;
MARLIN, TE .
CANADIAN JOURNAL OF CHEMICAL ENGINEERING, 1991, 69 (01) :35-47
[5]   Extended PLS approach for enhanced condition monitoring of industrial processes [J].
Kruger, U ;
Chen, Q ;
Sandoz, DJ ;
McFarlane, RC .
AICHE JOURNAL, 2001, 47 (09) :2076-2091
[6]   UNTITLED [J].
MACGREGOR, H .
CHROMOSOME RESEARCH, 1995, 3 (01) :3-4
[7]  
MACGREGOR JF, 1991, P CPC4 INT C CHEM PR, P665
[8]   Batch process monitoring for consistent production [J].
Martin, EB ;
Morris, AJ ;
Papazoglou, MC ;
Kiparissides, C .
COMPUTERS & CHEMICAL ENGINEERING, 1996, 20 :S599-S604
[9]  
Miller P., 1998, Applied Mathematics and Computer Science, V8, P775
[10]  
Morud TE, 1996, J CHEMOMETR, V10, P669, DOI 10.1002/(SICI)1099-128X(199609)10:5/6<669::AID-CEM467>3.0.CO