Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology

被引:82
作者
Estribeau, M [1 ]
Magnan, P [1 ]
机构
[1] SUPAERO, Integrated Image Sensors Lab, F-31400 Toulouse, France
来源
DETECTORS AND ASSOCIATED SIGNAL PROCESSING | 2004年 / 5251卷
关键词
CMOS image sensors; modulation transfer function; slanted-edge method;
D O I
10.1117/12.513320
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ISO 12233 standard provides a fast and efficient way of measuring Modulation Transfer Function (MTF) of digital input devices (such a digital still camera) using a normalized reflective target based on a. slanted-edge method. A similar methodology has been applied for measuring MTF of CMOS image sensors, using 12233 slanted-edge technique associated with a prototype transmissive target. In order to validate the results, comparisons have been made between MTF measurements of image sensor implemented using a 0.25 mum process, using this method and sine target direct measurements.
引用
收藏
页码:243 / 252
页数:10
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