Observation of SrTiO3 step edge dynamics by real-time high-temperature STM

被引：45

作者：

Lippmaa, M ^{[1
]}

Kawasaki, M

Ohtomo, A

Sato, T

Iwatsuki, M

Koinuma, H

机构：

[1] Tokyo Inst Technol, Dept Innovat & Engineered Mat, Tokyo, Japan

[2] Jeol Ltd, Elect Opt Div, Akishima, Tokyo 196, Japan

[3] Tokyo Inst Technol, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 226, Japan

[4] Japan Sci & Technol Corp 4259, CREST, Midori Ku, Yokohama, Kanagawa 226, Japan

来源：

APPLIED SURFACE SCIENCE | 1998年 / 130卷

基金：

日本学术振兴会;

关键词：

SrTiO(3) step edge dynamics; real-time high-temperature STM; surface atoms;

D O I：

10.1016/S0169-4332(98)00119-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have used high-temperature scanning tunneling microscopy (STM) to study in real time SrTiO(3) step edge dynamics in the 600 degrees C to 800 degrees C temperature range. We observed a dramatic transformation of the step edge structure above 690 degrees C, involving step edge straightening due to rapid migration of surface atoms. The STM study shows that if a NH(4)F-HF-etched substrate is annealed at 800 degrees C, a well-ordered surface, suitable for high-T(c) superconductor thin film deposition, can be produced. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：582 / 586

页数：5

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