Soft X-ray Microscopy to characterize polyelectrolyte assemblies

被引：18

作者：

Koehler, Karen ^{[1
]}

Dejugnat, Christophe

Dubois, Monique

Zemb, Thomas

Sukhorukov, Gleb B.

Guttmann, Peter

Moehwald, Helmuth

机构：

[1] Max Planck Inst Colloids & Interfaces, D-14424 Potsdam, Germany

[2] CEA Valrho, Inst Chim Separat Marcoule, Bagnols Sur Ceze, France

[3] CEA Saclay, DRECAM SCM, Lab Claude Frejacques, F-91191 Gif Sur Yvette, France

[4] Queen Mary Univ London, Dept Mat, London E1 4NS, England

[5] Univ Gottingen, Inst Rontgenphys, BESSY, Berlin, Germany

来源：

JOURNAL OF PHYSICAL CHEMISTRY B | 2007年 / 111卷 / 29期

关键词：

D O I：

10.1021/jp070360+

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Transmission microscopy with soft X-rays (TXM) is applied to image in-situ polyelectrolyte assemblies in aqueous environment. The method is element specific and at this stage exhibits a lateral resolution of 20 nm. With the specific examples of hollow capsules and full spheres made of PAH/PSS polyelectrolyte multilayers, it is shown quantitatively that heat treatment irreversibly reduces the water content in the membrane. These experiments complement those reported recently on the polyion system PDADMAC/PSS, which shows a different glass-transition behavior. Finally, the potential and present limitations of TXM are discussed.

引用

页码：8388 / 8393

页数：6

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