Superhard nanocrystalline silicon carbide films

被引:96
作者
Liao, F [1 ]
Girshick, SL
Mook, WM
Gerberich, WW
Zachariah, MR
机构
[1] Univ Minnesota, Dept Engn Mech, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[3] Univ Maryland, Dept Mech Engn & Chem, College Pk, MD 20742 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1920434
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanocrystalline silicon carbide films were deposited by thermal plasma chemical vapor deposition, with film growth rates on the order of 10 mu m/min. Films were deposited on molybdenum substrates, with substrate temperature ranging from 750-1250 degrees C. The films are composed primarily of beta-SiC nanocrystallites. Film mechanical properties were investigated by nanoindentation. As substrate temperature increased the average grain size, the crystalline fraction in the film, and the hardness all increased. For substrate temperatures above 1200 degrees C the average grain size equaled 10-20 nm, the crystalline fraction equaled 80-85%, and the film hardness equaled approximately 50 GPa. (c) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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