Scanning nonlinear dielectric microscope with submicron resolution

被引：15

作者：

Cho, YS

Matsuura, K

Kushibiki, J

机构：

[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

[2] Yamaguchi Univ, Fac Engn, Dept Elect & Elect Engn, Ube, Yamaguchi 7558611, Japan

[3] Tohoku Univ, Fac Engn, Dept Elect Engn, Sendai, Miyagi 9808577, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1998年 / 37卷 / 5B期

关键词：

scanning nonlinear dielectric microscope; ferroelectric domain; lithium tantalate; proton exchanged inversion layer; PZT ceramics;

D O I：

10.1143/JJAP.37.3132

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titannte ceramics.

引用

页码：3132 / 3133

页数：2