Broadband enhanced backscattering spectroscopy of strongly scattering media

被引：30

作者：

Muskens, O. L. ^{[1
]}

Lagendijk, A. ^{[1
]}

机构：

[1] FOM, Inst Atom & Mol Phys AMOLF, Ctr Nanophoton, NL-1098 SJ Amsterdam, Netherlands

来源：

OPTICS EXPRESS | 2008年 / 16卷 / 02期

关键词：

D O I：

10.1364/OE.16.001222

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on a new experimental method for enhanced backscattering spectroscopy (EBS) of strongly scattering media over a bandwidth from 530-1000 nm. The instrument consists of a supercontinuum light source and an angle-dependent detection system using a fiber-coupled grating spectrometer. Using a combination of two setups, the backscattered intensity is obtained over a large angular range and using circularly polarized light. We present broadband EBS of a TiO2 powder and of a strongly scattering porous GaP layer. In combination with theoretical model fits, the EBS system yields the optical transport mean free path over the available spectral window. (c) 2008 Optical Society of America.

引用

页码：1222 / 1231

页数：10

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