Pulse length and terminal-level lifetime dependence of energy extraction for neodymium-doped phosphate amplifier glass

被引：12

作者：

Bibeau, C

Trenholme, JB

Payne, SA

机构：

[1] Lawrence Livermore Natl. Laboratory, Livermore

[2] University of Oregon, Eugene, OR

[3] University of Davis, CA

[4] Laser Program, Lawrence Livermore Natl. Laboratory, Livermore, CA

[5] Indian Institute of Technology, Kanpur

[6] Optical Sciences Group, Naval Research Laboratory, Washington, DC

[7] Lawrence Livermore Natl. Laboratory, Livermore, CA

[8] State University of New York, Binghamton, NY

[9] Princeton University, Princeton, NJ

[10] University of Pennsylvania, Philadelphia, PA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1996年 / 32卷 / 08期

关键词：

D O I：

10.1109/3.511562

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

On the basis of detailed numerical calculations, we have;formulated an empirical expression for the saturation fluence in neodymium-doped phosphate amplifier glass that explicitly depends upon the ratio of the pulse width to the terminal-level lifetime, The empirical expression, when substituted within the Frantz-Nodvik solution for energy extraction, can be used to determine the impact of the lower level lifetime on the energy extracted from Nd:phosphate glass amplifiers, We used our empirical solution to model experimental gain-saturation data and determine the terminal-level lifetime, We compared this value with two independent experiments and found that all three experiments yielded similar results, The terminal-level lifetime of LG-750 at room temperature is found to be 253 ps +/- 50 ps.

引用

页码：1487 / 1496

页数：10

共 17 条

[1] DIRECT MEASUREMENTS OF THE TERMINAL LASER LEVEL LIFETIME IN NEODYMIUM-DOPED CRYSTALS AND GLASSES [J].