Force microscopy and surface interactions

被引：120

作者：

Senden, TJ ^{[1
]}

机构：

[1] Australian Natl Univ, Res Sch Phys Sci & Engn, Dept Appl Math, Canberra, ACT 0200, Australia

来源：

CURRENT OPINION IN COLLOID & INTERFACE SCIENCE | 2001年 / 6卷 / 02期

关键词：

atomic force microscopy; surface force measurement; cantilever; colloids; tip-sample interactions; single molecule elongation; force spectroscopy; thermal noise;

D O I：

10.1016/S1359-0294(01)00067-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The force microscope provides the most flexible of surface force measurement techniques for probing the richness and complexity of surface interactions. The technique is reviewed over the past 3 years for developments in instrumentation, colloidal force measurement, and nano-mechanical measurements on single molecules. (C) 2001 Elsevier Science Ltd. AU rights reserved.

引用

页码：95 / 101

页数：7

共 64 条

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