Super-resolution imaging through a planar silver layer

被引:406
作者
Melville, DOS [1 ]
Blaikie, RJ [1 ]
机构
[1] Univ Canterbury, MacDiarmid Inst Adv Mat & Nanotechnol, Dept Elect & Comp Engn, Christchurch 1, New Zealand
关键词
All Open Access; Gold; Green;
D O I
10.1364/OPEX.13.002127
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
It has been proposed that a planar silver layer could be used to project a super-resolution image in the near field when illuminated near its plasma frequency [J. B. Pendry, Phys. Rev. Lett. 86, 3966 (2000)]. This has been investigated experimentally using a modified form of conformal-mask photolithography, where dielectric spacers and silver layers are coated onto a tungsten-on-glass mask. We report here on the experimental confirmation that super-resolution imaging can be achieved using a 50-nm thick planar silver layer as a near-field lens at wavelengths around 365 nm. Gratings with periods down to 145 nm have been resolved, which agrees well with our finite-difference time domain (FDTD) simulations. (C) 2005 Optical Society of America.
引用
收藏
页码:2127 / 2134
页数:8
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