CdO thin films:: a study of their electronic structure by electron spin resonance spectroscopy

被引：37

作者：

Gulino, A

Tabbì, G

机构：

[1] Univ Catania, Dipartimento Sci Chim, INSTM UdR Catania, I-95125 Catania, Italy

[2] CNR, Ist Biostrutt & Bioimmagini, I-95125 Catania, Italy

来源：

APPLIED SURFACE SCIENCE | 2005年 / 245卷 / 1-4期

关键词：

CdO; ESR; MOCVD; film;

D O I：

10.1016/j.apsusc.2004.10.026

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The Cd(C5F6HO2)(2)center dot polyether adducts were used in MOCVD experiments of cadmium oxide, on optical transparent SiO2 substrates. Very mild heating (44-74 degrees C resulted in, thermal stable, liquid compounds that can be easily evaporated. XRD measurements provided evidence of cubic highly textured CdO(1 0 0) films. The surface atomic composition was investigated by XPS analysis. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%. Resistivity measurements of CdO thin films showed that they are highly conducting. ESR analysis suggests the presence of Cd+ ions, on the site of Cd2+ arising from polaronic self-trapping of electrons introduced by oxygen deficiency at Cd2+ sites to generate localised 5s(1) states. (c) 2004 Elsevier B.V. All rights reserved.

引用

页码：322 / 327

页数：6

共 37 条

[1] Tracking in detail the synthesis of cadmium oxide from a hydroxyl gel using combinations of in situ X-ray absorption fine structure spectroscopy, X-ray diffraction, and small-angle X-ray scattering [J].