Surface roughness statistics and temperature step stress effects for D-T solid layers equilibrated inside a 2 mm beryllium torus

被引:10
作者
Sheliak, JD
Hoffer, JK
机构
[1] Gen Atom Co, Los Alamos, NM 87545 USA
[2] Univ Calif Los Alamos Natl Lab, Los Alamos, NM 87545 USA
来源
FUSION TECHNOLOGY | 1999年 / 35卷 / 02期
关键词
D O I
10.13182/FST99-A11963930
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Solid D-T layers are equilibrated inside a 2 mm diameter beryllium toroidal cell at temperatures ranging from 19.0 K to 19.6 K, using the beta-layering process. Each experimental run consisted of multiple cycles of rapid- or slow-freezing of the initially liquid D-T charge. Each of these freeze cycles was followed by a lengthy period of beta-layering equilibration, which was terminated by melting the layer. The temperature was changed in discrete steps at the end of some equilibration cycles in an attempt to simulate actual ICF target conditions. High-precision images of the D-T solid-vapor interface were analyzed to yield the surface roughness sigma(rms) as a sum of modal contributions. Results show an average sigma(rms) of 1.3 +/- 0.3 mu m for layers equilibrated at 19.0 K and show an inverse dependence of sigma(rms) on equilibration temperature up to 19.525 K. Inducing sudden temperature perturbations <(lowered)under bar> sigma(rms) to 1.0 +/- 0.05 mu m.
引用
收藏
页码:234 / 243
页数:10
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