High voltage Cu(In,Ga)Se2 devices with Ga-profiling fabricated using co-evaporation

被引:9
作者
Bodegård, M [1 ]
Lundberg, O [1 ]
Malmström, J [1 ]
Stolt, L [1 ]
机构
[1] Angstrom Solar Ctr, SE-75121 Uppsala, Sweden
来源
CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000 | 2000年
关键词
D O I
10.1109/PVSC.2000.915867
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The influence of bandgap profiling of Cu(In,Ga)Se-2 absorbers for thin film solar cells has been investigated. Profiles have been obtained by depositing CuGaSe2 back surface layers in the beginning of the Cu(In,Ga)Se-2 growth process. Two different concentrations of Ga was used for the non-graded part of the Cu(In,Ga)Se-2 film corresponding to Ga/(Ga+In) ratios of 0.2 and 0.5. The interdiffusion of Ga and In was studied and it was found that, although substantial interdiffusion occurred, a back surface layer with a high Ga content remained as analyzed with SIMS and XRD. The main influence on the solar cell parameters, by widening of the bandgap towards the back contact using this Ga-rich back surface layer, was found to be an enhancement of the efficiency by improved voltage.
引用
收藏
页码:450 / 453
页数:4
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