Monocrystalline Si waffles for thin solar cells fabricated by the novel perforated-silicon process

被引:20
作者
Brendel, R
Artmann, H
Oelting, S
Frey, W
Werner, JH
Queisser, HJ
机构
[1] ZAE Bayern, Bavarian Ctr Appl Energy Res, D-91058 Erlangen, Germany
[2] Robert Bosch GmbH, Zent Bereich Forsch & Vorausentwicklung, Avt FV FLD, D-70839 Gerlingen, Germany
[3] ANTEC GMBH, D-65779 Kelkheim, Germany
[4] Univ Stuttgart, Inst Phys Elekt, D-70569 Stuttgart, Germany
[5] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 67卷 / 02期
关键词
D O I
10.1007/s003390050753
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We apply the novel perforated-silicon process ("psi-process") for the fabrication of thin (a few microns thick) monocrystalline silicon layers for solar cells with textured surfaces for efficient light trapping. A silicon layer grows epitaxially on the porous surface of a textured monocrystalline Si substrate. Mechanical stress splits the porous layer and thereby separates the epitaxial layer from the substrate. X-ray diffraction analysis proves monocrystallinity for our 5.8-mu m-thick Si layer. Ray tracing simulations correctly model the optical reflectance measurements. The simulations predict a maximum short-circuit current of 36.5 mA/cm(2) for this waffle-shaped film when it is attached to glass substrates.
引用
收藏
页码:151 / 154
页数:4
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