Investigation of strong electric-field induced surface phenomena by soft X-UV laser interferometry

被引：34

作者：

Zeitoun, P

Albert, F

Jaegle, P

Joyeux, D

Carillon, A

Hubert, S

Jamelot, G

Klisnick, A

Phalippou, D

Lagron, JC

Ros, D

Sebban, S

Zeitoun-Fakiris, A

机构：

[1] Univ Paris Sud, LSAI, Ctr Orsay, F-91405 Orsay, France

[2] Univ Paris Sud, IOTA, F-91405 Orsay, France

[3] CENS, CEA, SEA, DAPNIA,DSM, F-91191 Gif Sur Yvette, France

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1998年 / 416卷 / 01期

关键词：

X-ray laser; interferometry; surface morphology; electric field;

D O I：

10.1016/S0168-9002(98)00753-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Transient perturbed niobium surface states are observed for the first time during a long continued action of the applied DC-field owing to surface imaging by the means of an X-UV laser interferometry technique. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：189 / 191

页数：3

共 6 条

[1] Interferograms obtained with a X-ray laser by means of a wavefront division interferometer [J].