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A method of electron diffraction intensity correction in combination with high-resolution electron microscopy

被引：28
作者：
Huang, DX
Liu, W
Gu, YX
Xiong, JW
Fan, HF
Li, FH
机构：
[1] CHINESE ACAD SCI,INST PHYS,BEIJING 100080,PEOPLES R CHINA
[2] CHINESE ACAD SCI,INST PHYS,NATL LAB HIGH TEMP SUPERCONDUCT,BEIJING 100080,PEOPLES R CHINA
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1996年 / 52卷
关键词：
D O I：
10.1107/S0108767395012682
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
An empirical method is proposed for partially correcting the distortion of electron diffraction intensity caused by Ewald-sphere curvature, crystal bending, thickness inhomogeneity etc. The method is based on the combination of electron diffraction and high-resolution electron microscopy. It has been tested with a crystal of high-temperature superconducting oxide YBa2Cu3O7-x and shown to be effective.
引用
收藏
页码：152 / 157
页数：6
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