Dead-time correction of a multi-element SSD for fluorescent XAFS

被引：54

作者：

Nomura, M ^{[1
]}

机构：

[1] KEK, Photon Factory, Inst Mat Struct Sci, Tsukuba, Ibaraki 305, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷

关键词：

solid-state detector systems; fluorescent XAFS; dead-time corrections; counting losses;

D O I：

10.1107/S090904959800003X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The correct evaluation of the live time of a detection system is found to be important for correcting the counting loss of a multielement detection system for fluorescent XAFS experiments. Synchronous resetting of preamplifiers and the suspension of electronics during the reset period is an effective method. The dead time of the incoming count rate should also be corrected, since its non-linearity cannot be neglected. A 19-element solid-state detector system which can count up to 3.7 x 10(5) counts s(-1) channel(-1) with <270 eV FWHM for Mn K alpha has been realized; the dead time was independent of the incoming photon energy.

引用

页码：851 / 853

页数：3

共 6 条

[1] A 13-ELEMENT GE DETECTOR FOR FLUORESCENCE EXAFS [J].

CRAMER, SP ;

TENCH, O ;

YOCUM, M ;

GEORGE, GN .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1988, 266 (1-3) :586-591

[2]

DERBYSHIRE GE, 1991, ADV X RAY ANAL, V34, P187

[3] THE PENTAFET AND ITS APPLICATIONS IN HIGH-RESOLUTION AND HIGH-RATE RADIATION SPECTROMETERS [J].

NASHASHIBI, T .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 322 (03) :551-556

[4]

NOMURA M, 1996, 9515 KEK, P305

[5]

WARBURTON WK, 1986, NUCL INSTRUM METH A, V246, P541, DOI 10.1016/0168-9002(86)90148-8

[6] THE CORRECTION OF THE DEAD-TIME LOSS OF THE GE DETECTOR IN X-RAY-ABSORPTION SPECTROSCOPY [J].

ZHANG, K ;

ROSENBAUM, G ;

BUNKER, G .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 :147-149

← 1 →