Nanoscale surface clustering on CdTe epilayers

被引:23
作者
Marsal, L
Mariette, H
Samson, Y
Rouviere, JL
Picard, E
机构
[1] Univ Grenoble 1, CNRS, Spectrometrie Phys Lab, CEA,Grp Microstruct Semicond 2 4, F-38041 St Martin Dheres, France
[2] CEA Grenoble, DRFMC SP2M, F-38054 Grenoble 9, France
关键词
D O I
10.1063/1.122648
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied the surface morphology of two dimensional CdTe films grown by atomic layer epitaxy on CdZnTe buffers. Atomic force microscopy observations in air show a strong evolution of the surface after the growth by forming clusters of around 20 nm in diameter and 3 nm in height. The size increase of these clusters as time proceeds is directly related to the formation of tellurium and cadmium oxides on the surface as revealed by x-ray photoelectron spectroscopy data. This nanoscale clustering then occurs ex situ, due to exposure to atmosphere which induces an oxidation of the CdTe epilayers. (C) 1998 American Institute of Physics. [S0003-6951(98)03846-7].
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页码:2974 / 2976
页数:3
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