Power reflection coefficient analysis for complex impedances in RFID tag design

被引：249

作者：

Nikitin, PV ^{[1
]}

Rao, KVS ^{[1
]}

Lam, SF ^{[1
]}

Pillai, V ^{[1
]}

Martinez, R ^{[1
]}

Heinrich, H ^{[1
]}

机构：

[1] Intermec Technol Corp, Everett, WA 98203 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2005年 / 53卷 / 09期

关键词：

antennas; integrated circuits (ICs); power reflection; RF identification (RFID);

D O I：

10.1109/TMTT.2005.854191

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Kurokawa's method of calculating the power reflection coefficient from the Smith chart in the situation when one complex impedance is directly connected to another is applied to passive RFID tag design, where power reflection is important, as it determines the tag characteristics. The performance analysis of a specific RFID tag is presented together with experimental data, which is in close agreement with the theory.

引用

页码：2721 / 2725

页数：5

共 6 条

[1]

Finkenzeller K, 1999, RFID HDB RADIO FREQU

[2] POWER WAVES AND SCATTERING MATRIX [J].